In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques
- Author
- RODENHAUSEN, K. B1 2 ; DUENSING, B. A3 ; KASPUTIS, T3 4 ; PANNIER, A. K3 4 ; HOFMANN, T2 5 ; SCHUBERT, M2 5 ; TIWALD, T. E6 ; SOLINSKY, M7 ; WAGNER, M7
[1] Department of Chemical and Biomolecular Engineering, University of Nebraska-Lincoln, United States
[2] Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, United States
[3] Department of Biological Systems Engineering, University of Nebraska-Lincoln, United States
[4] Biomedical Engineering Program, University of Nebraska-Lincoln, United States
[5] Department of Electrical Engineering, University of Nebraska-Lincoln, United States
[6] J.A. Woollam Co., Inc., 645 Main Street, Suite 102, Lincoln, NE 68508, United States
[7] The Procter & Gamble Company, 11810 E. Miami River Rd., Cincinnati, OH 45252, United States - Conference title
- 5th International Conference on Spectroscopic Ellipsometry (ICSE-V)
- Conference name
- International Conference on Spectroscopic Ellipsometry (ICSE-V) (ICSE-V) (5 ; Albany, NY 2010-05-23)
- Author (monograph)
- TOMPKINS, Harland G (Editor)
- Source
Thin solid films. 2011, Vol 519, Num 9, pp 2817-2820, 4 p ; ref : 24 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Alkanethiols Quartz crystal microbalance SAMs Self-assembled monolayers Spectroscopic ellipsometry
- Keyword (fr)
- Alcanethiol Chimisorption Couche autoassemblée Ellipsométrie spectroscopique Ethanol Microbalance quartz Or Porosité 0760F
- Keyword (en)
- Alkanethiol Chemisorption Self-assembled layers Spectroscopic ellipsometry Ethanol Quartz microbalance Gold Porosity
- Keyword (es)
- Alcanotiol Elipsometría espectroscópica Microbalanza cuarzo
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24100045
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2010.11.081 
https://dx.doi.org/10.1016/j.tsf.2010.11.081
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