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Improved Device Driver Reliability Through Hardware Verification Reuse

Autor
RYZHYK, Leonid1 2 ; KEYS, John3 ; MIRLA, Balachandra1 2 ; RAGHUNATH, Arun3 ; VIJ, Mona3 ; HEISER, Gernot1 2
[1] NICTA, Australia
[2] University of New South Wales, Australia
[3] Intel Corporation, Australia
Titulo de la conferencia
Proceedings of the Sixteenth International Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS XVI), March 5-11, 2011, Newport Beach, CA, USA
Nombre de la conferencia
International Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS) (ASPLOS) (16 ; Newport Beach, CA 2011-03-05)
Autor ( monografía)
Association for Computing Machinery (ACM), Special Interest Group on Computer Architecture (SIGARCH), New York, NY, United States (Organiser of meeting)
Association for Computing Machinery (ACM), Special Interest Group on Programming Languages (SIGPLAN), New York, NY, United States (Organiser of meeting)
Association for Computing Machinery (ACM), Special Interest Group on Operating Systems (SIGOPS), New York, NY, United States (Organiser of meeting)
Fuente

ACM SIGPLAN notices. 2011, Vol 46, Num 3, pp 133-144, 12 p ; ref : 29 ref

ISSN
1523-2867
Campo Científico
Computer science
Editor
Association for Computing Machinery, New York, NY
País de la publicación
United States
Tipo de documento
Conference Paper
Idioma
English
Palabra clave de autor
Automated Testing Co-verification Device Drivers RTL Testbenches Reliability Verification
Palabra clave (fr)
Conception conjointe Couverture test Diminution coût Duplication Défaut Développement logiciel Fiabilité Niveau transfert registre Pilote périphérique Réutilisation Système exploitation Unification Vérification matériel Vérification programme
Palabra clave (in)
Codesign Test coverage Cost lowering Duplication Defect Software development Reliability Register transfer level Device driver Reuse Operating system Unification Hardware verification Program verification
Palabra clave (es)
Diseño conjunto Test cubierta Reducción costes Duplicación Defecto Desarrollo logicial Fiabilidad Registro RTL Piloto periférico Reutilización Sistema operativo Unificación Verificacion hardware Verificación programa
Clasificación
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B03 Language processing and microprogramming

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B04 Computer systems and distributed systems. User interface

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B09 Software engineering

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B10 Computer systems performance. Reliability

Disciplina
Computer science : theoretical automation and systems
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
24109208

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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