A Survey of Combinatorial Testing
- Author
- CHANGHAI NIE1 ; LEUNG, Hareton2
[1] Nanjing University, China
[2] Hong Kong Polytechnic University, Hong-Kong - Source
ACM computing surveys. 2011, Vol 43, Num 2 ; 11.1-11.29 ; ref : 4 p
- CODEN
- CMSVAN
- ISSN
- 0360-0300
- Scientific domain
- Computer science
- Publisher
- Association for Computing Machinery, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Design Experimentation Reliability Software testing Verification combinatorial testing (CT) covering array test case generation
- Keyword (fr)
- Analyse algorithme Diagnostic panne Echantillonnage Fiabilité Génération test Modélisation Méthode empirique Métrique Priorité Vérification programme
- Keyword (en)
- Algorithm analysis Fault diagnostic Sampling Reliability Test generation Modeling Empirical method Metric Priority Program verification
- Keyword (es)
- Análisis algoritmo Diagnóstico pana Muestreo Fiabilidad Generación prueba Modelización Método empírico Métrico Prioridad Verificación programa
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B10 Computer systems performance. Reliability
- Discipline
- Computer science : theoretical automation and systems
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24158394
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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