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A Survey of Combinatorial Testing

Author
CHANGHAI NIE1 ; LEUNG, Hareton2
[1] Nanjing University, China
[2] Hong Kong Polytechnic University, Hong-Kong
Source

ACM computing surveys. 2011, Vol 43, Num 2 ; 11.1-11.29 ; ref : 4 p

CODEN
CMSVAN
ISSN
0360-0300
Scientific domain
Computer science
Publisher
Association for Computing Machinery, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
Design Experimentation Reliability Software testing Verification combinatorial testing (CT) covering array test case generation
Keyword (fr)
Analyse algorithme Diagnostic panne Echantillonnage Fiabilité Génération test Modélisation Méthode empirique Métrique Priorité Vérification programme
Keyword (en)
Algorithm analysis Fault diagnostic Sampling Reliability Test generation Modeling Empirical method Metric Priority Program verification
Keyword (es)
Análisis algoritmo Diagnóstico pana Muestreo Fiabilidad Generación prueba Modelización Método empírico Métrico Prioridad Verificación programa
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B10 Computer systems performance. Reliability

Discipline
Computer science : theoretical automation and systems
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
24158394

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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