Field emission from carbon nanotubes ; purified single-walled and multi-walled tubes
- Author
- SAITO, Y1 ; HAMAGUCHI, K1 ; HATA, K1 ; TOHJI, K2 ; KASUYA, A3 ; NISHINA, Y3 ; UCHIDA, K4 ; TASAKA, Y4 ; IKAZAKI, F4 ; YUMURA, M4
[1] Department of Electrical and Electronic Engineering, Mie University, Tsu 514, Japan
[2] Department of Geoscience and Technology, Tohoku University, Sendai 980-77, Japan
[3] Institute for Materials Research, Tohoku University, Sendai 980-77, Japan
[4] National Institute of Materials and Chemical Research, Tsukuba 305, Japan - Conference title
- Field Emission '97 International Field Emission Symposium
- Conference name
- Field Emission '97 International Field Emission Symposium (44 ; Tsukuba 1997-07-07)
- Author (monograph)
- HONO, K (Editor)1 ; TSUKADA, M (Editor)2
International Field Emission Society, International (Funder/Sponsor)
NRIM National Research Institute for Metals, Tsukuba, Japan (Funder/Sponsor)
[1] National Resarch Institute for Metals, Tsukuba, Japan
[2] University of Tokyo, Tokyo, Japan - Source
Ultramicroscopy. 1998, Vol 73, Num 1-4, pp 1-6 ; ref : 15 ref
- CODEN
- ULTRD6
- ISSN
- 0304-3991
- Scientific domain
- Cell biology, histology; Crystallography; Physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Caractéristique courant tension Carbone Etude expérimentale Fullerènes Microscopie électronique émission champ Nanostructure Source particule Source électron Tube Nanotube
- Keyword (en)
- IV characteristic Carbon Experimental study Fullerenes Field emission electron microscopy Nanostructures Particle sources Electron sources Tubes
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G77 Atomic, molecular and charged-particle sources and detectors / 001B00G77K Charged-particle beam sources and detectors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16F Field emission- and field-ion microscopy
- Discipline
- Metrology Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2435381
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0304-3991(97)00128-9 
https://dx.doi.org/10.1016/S0304-3991(97)00128-9
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