The Pole Condition as Transparent Boundary Condition for Resonance Problems: Detection of Spurious Modes
- Author
- KETTNER, Benjamin1 ; SCHMIDT, Frank1
[1] Zuse Institute Berlin, Takustrasse 7, 14195 Berlin, Germany - Conference title
- Physics and simulation of optoelectronic devices XIX (24-27 January 2011, San Francisco, California, United States)
- Conference name
- Physics and simulation of optoelectroni devices (19 ; San Francisco CA 2011)
- Author (monograph)
- Witzigmann, Bernd (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7933 ; 79331B.1-79331B.11 ; ref : 23 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-8470-3
- Scientific domain
- Electronics; Energy; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham WA
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse sensibilité Condition aux limites Dispositif optoélectronique Valeur propre 0130C
- Keyword (en)
- Sensitivity analysis Boundary conditions Optoelectronic devices Eigenvalues
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24367162
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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