The Mirror Module Design for the Cryogenic X-Ray Imaging Spectrometer on-board ORIGIN
- Author
- BARBERA, Marco1 2 ; MINEO, Teresa3 ; BASSO, Stefano4 ; CHRISTENSEN, Finn Erland5 ; DEN HERDER, Jan-Willem6 ; KAASTRA, Jelle6 ; PIRO, Luigi7 ; SPIGA, Daniele4 ; VAN BAREN, Coen6
[1] Dipartimento Di Fisica, Università di Palermo, Via Archirafi 36, 90123 Palermo, Italy
[2] INAF-Osservatorio Astronomico G.S. Vaiana, Piazza del Parlamento 1, 90134 Palermo, Italy
[3] INAF-Istituto di Astrofisica Spaziale e Fisica Cosmica, Via U. La Malfa 153, 90146 Palermo, Italy
[4] INAF-Osservatorio Astronomico di Brera, Via Bianchi 46, 23807 Merate (Lc), Italy
[5] Danish National Space Center, Juliane maries Vej 30, 2100 Copenhagen, Denmark
[6] SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, Netherlands
[7] INAF-Ist. di Astrofisica Spaziale e Fisica Cosmica, Via Fosso del Cavaliere 100, 00133 Roma, Italy - Conference title
- EUV and x-ray optics (synergy between laboratory and space II)
- Conference name
- EUV and X-ray optics. Conference (02 ; Prague 2011-04-20)
- Author (monograph)
- Hudec, R (Editor); Pina, Ladislav (Editor)
SPIE, United States (Organiser of meeting)
ELI Beamlines (Organiser of meeting)
HiPER (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8076 ; 80760A.1-80760A.12 ; ref : 38 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-8666-0
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Calorimètre Distance focale Imagerie RX Incidence rasante Miroir Méthode mesure Optique RX Plan focal Rayon X Résolution angulaire Silicium Technique conception optique Tracé rayon Vision 0130C 4150 4215D 4215E
- Keyword (en)
- Calorimeters Focal length X-ray imaging Grazing incidence Mirrors Measuring methods X-ray optics Focal planes X radiation Angular resolution Silicon Optical design techniques Ray tracing Vision
- Keyword (es)
- Distancia focal Incidencia rasante
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40A Electromagnetism; electron and ion optics / 001B40A50 X-ray beams and x-ray optics
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B15 Geometrical optics / 001B40B15D Wave fronts and ray tracing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B15 Geometrical optics / 001B40B15E Optical system design
- Discipline
- Physics : electromagnetism Physics : optics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24504065
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.889269 
https://dx.doi.org/10.1117/12.889269
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