Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction
- Author
- SCHEUERLEIN, C1 ; DI MICHIEL, M2 ; SCHEEL, M2 ; JIANG, J3 ; KAMETANI, F3 ; MALAGOLI, A3 ; HELLSTROM, E. E3 ; LARBALESTIER, D. C3
[1] European Organization for Nuclear Research CERN, 1211 Geneva, Switzerland
[2] European Synchrotron Radiation Facility (ESRF), 6 rue Jules Horowitz, 38043 Grenoble, France
[3] Applied Superconductivity Center, National High Magnetic Field Laboratory, Florida State University, Tallahassee, FL 32310, United States - Source
Superconductor science & technology (Print). 2011, Vol 24, Num 11 ; 115004.1-115004.10 ; ref : 24 ref
- ISSN
- 0953-2048
- Scientific domain
- Electronics; Condensed state physics
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Bismuth Calcium Cuivre Strontium Oxyde Mixte Cavité dans réseau Composition phase Densité courant critique Diffraction RX Défaut Fil supraconducteur Méthode non destructive Phénomène transport Porosité Rayonnement synchrotron Supraconducteur haute température Tomographie Traitement thermique
- Keyword (en)
- Bismuth Calcium Copper Strontium Oxides Mixed Void Phase composition Critical current density X ray diffraction Defect Superconducting wires Non destructive method Transport process Porosity Synchrotron radiation High temperature superconductor Tomography Heat treatment
- Keyword (es)
- Bismuto Calcio Cobre Estroncio Óxido Mixto Cavidad en red Composición fase Densidad corriente crítica Difracción RX Defecto Método no destructivo Fenómeno transporte Porosidad Radiación sincrotrón Supraconductor alta temperatura Tomografía Tratamiento térmico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70D Superconductivity / 001B70D25 Properties of type I and type II superconductors / 001B70D25S Critical currents
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05C Materials
- Discipline
- Electrical engineering. Electroenergetics Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24728707
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0953-2048/24/11/115004 
https://dx.doi.org/10.1088/0953-2048/24/11/115004
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:30:\"10.1088\/0953-2048\/24\/11\/115004\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:9:\"\u0000*\u0000jtitle\";s:43:\"Superconductor science & technology (Print)\";s:9:\"\u0000*\u0000stitle\";s:32:\"Supercond. sci. technol. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2011\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:2:\"11\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"115004.1-115004.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0953-2048\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"SCHEUERLEIN\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:13:\"DI MICHIEL, M\";i:1;s:9:\"SCHEEL, M\";i:2;s:8:\"JIANG, J\";i:3;s:11:\"KAMETANI, F\";i:4;s:11:\"MALAGOLI, A\";i:5;s:15:\"HELLSTROM, E. E\";i:6;s:18:\"LARBALESTIER, D. C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:8:\"\u0000*\u0000place\";s:7:\"Bristol\";s:6:\"\u0000*\u0000pub\";s:20:\"Institute of Physics\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:30:\"10.1088\/0953-2048\/24\/11\/115004\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:9:\"\u0000*\u0000jtitle\";s:43:\"Superconductor science & technology (Print)\";s:9:\"\u0000*\u0000stitle\";s:32:\"Supercond. sci. technol. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2011\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:2:\"11\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"115004.1-115004.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0953-2048\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"SCHEUERLEIN\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:13:\"DI MICHIEL, M\";i:1;s:9:\"SCHEEL, M\";i:2;s:8:\"JIANG, J\";i:3;s:11:\"KAMETANI, F\";i:4;s:11:\"MALAGOLI, A\";i:5;s:15:\"HELLSTROM, E. E\";i:6;s:18:\"LARBALESTIER, D. C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:8:\"\u0000*\u0000place\";s:7:\"Bristol\";s:6:\"\u0000*\u0000pub\";s:20:\"Institute of Physics\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:30:\"10.1088\/0953-2048\/24\/11\/115004\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:30:\"10.1088\/0953-2048\/24\/11\/115004\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:9:\"\u0000*\u0000jtitle\";s:43:\"Superconductor science & technology (Print)\";s:9:\"\u0000*\u0000stitle\";s:32:\"Supercond. sci. technol. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2011\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:2:\"11\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"115004.1-115004.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0953-2048\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"SCHEUERLEIN\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:13:\"DI MICHIEL, M\";i:1;s:9:\"SCHEEL, M\";i:2;s:8:\"JIANG, J\";i:3;s:11:\"KAMETANI, F\";i:4;s:11:\"MALAGOLI, A\";i:5;s:15:\"HELLSTROM, E. E\";i:6;s:18:\"LARBALESTIER, D. C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:8:\"\u0000*\u0000place\";s:7:\"Bristol\";s:6:\"\u0000*\u0000pub\";s:20:\"Institute of Physics\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:30:\"10.1088\/0953-2048\/24\/11\/115004\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:9:\"\u0000*\u0000jtitle\";s:43:\"Superconductor science & technology (Print)\";s:9:\"\u0000*\u0000stitle\";s:32:\"Supercond. sci. technol. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2011\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:2:\"11\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:18:\"115004.1-115004.10\";s:7:\"\u0000*\u0000issn\";s:9:\"0953-2048\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:11:\"SCHEUERLEIN\";s:10:\"\u0000*\u0000aufirst\";s:1:\"C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:13:\"DI MICHIEL, M\";i:1;s:9:\"SCHEEL, M\";i:2;s:8:\"JIANG, J\";i:3;s:11:\"KAMETANI, F\";i:4;s:11:\"MALAGOLI, A\";i:5;s:15:\"HELLSTROM, E. E\";i:6;s:18:\"LARBALESTIER, D. C\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:157:\"Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction\";s:8:\"\u0000*\u0000place\";s:7:\"Bristol\";s:6:\"\u0000*\u0000pub\";s:20:\"Institute of Physics\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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