Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosion
- Author
- CROSTA, Giovanni F1
[1] Inverse Problems & Mathematical Morphology Laboratory DLSAT, Università degli Studi Milano-Bicocca, Rm. U1-T009, Piazza della Scienza 1, 20126 Milan, Italy - Conference title
- Scanning microscopies 2011 (advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences) = 26-28 April 2011, Orlando, Florida, United States (en)
- Conference name
- Scanning microscopies : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences. Conference (Orlando FL 2011-04-26)
- Author (monograph)
- Postek, Michael T (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8036 ; 80360H.1-80360H.10 ; ref : 33 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-8610-3
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham WA
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Acier Analyse image Corrosion Eau Filtrage non linéaire Homme Microanalyse Microscope balayage Microscopie électronique balayage Morphologie surface Rugosité Spectrométrie RX 0130C 0778 4230
- Keyword (en)
- Steels Image analysis Corrosion Water Non linear filtering Man Microanalysis Scanning microscope Scanning electron microscopy Surface morphology Roughness X-ray spectroscopy
- Keyword (es)
- Filtrado no lineal Microscopio barrido
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing
- Discipline
- Metrology Physics : optics Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24756816
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.883231 
https://dx.doi.org/10.1117/12.883231
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