Circuit techniques for reducing the effects of op-amp imperfections : Autozeroing, correlated double sampling, and chopper stabilization
- Author
- ENZ, C. C1 ; TEMES, G. C2
[1] Swiss Federal Institute of Technology, Lausanne (EPFL), Electronics Laboratory (LEG), ELB-Ecublens, 1015 Lausanne, Switzerland
[2] Department of Electrical and Computer Engineering, Oregon State University, Corvallis, OR 97331-3211, United States - Source
Proceedings of the IEEE. 1996, Vol 84, Num 11, pp 1583-1614, 31 p ; ref : 74 ref
- CODEN
- IEEPAD
- ISSN
- 0018-9219
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Amplificateur opérationnel Bruit basse fréquence Circuit intégré Hacheur Implémentation Réduction bruit Stabilisation Technologie MOS complémentaire
- Keyword (en)
- Operational amplifier 1/f noise Integrated circuit Chopper Implementation Noise reduction Stabilization Complementary MOS technology
- Keyword (es)
- Amplificador operacional Ruido baja frecuencia Circuito integrado Picador Ejecución Reducción ruido Estabilización Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2477954
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/5.542410 
https://dx.doi.org/10.1109/5.542410
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