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The Target Implant Method for Predicting Target Difficulty and Detector Performance in Hyperspectral Imagery

Author
BASENER, William F1 ; NANCE, Eric2 ; KEREKES, John1
[1] Rochester Institute of Technology, Rochester, NY, United States
[2] Raytheon, United States
Conference title
Algorithms and technologies for multispectral, hyperspectral, and ultraspectral imagery XVII (25-28 April 2011, Orlando, Florida, United States)
Conference name
Algorithms and technologies for multispectral, hyperspectral, and ultraspectral imagery. Conference (17 ; Orlando FL 2011-04-25)
Author (monograph)
Shen, Sylvia S (Editor); Lewis, Paul E (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8048 ; 80481H.1-80481H.9 ; ref : 9 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-8622-6
Scientific domain
Electronics; Computer science; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham WA
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Algorithme Capteur imagerie hyperspectral Détection cible Filtre adapté Imagerie Implant Pixel Traitement image 0130C 0705P 4230V 4279P
Keyword (en)
Algorithms Hyperspectral imaging sensor Target detection Matched filters Imagery Implants Pixel Image processing
Keyword (es)
Sensor hiperespectral de formación de imágenes Detección blanco Imaginería Pixel
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G05 Computers in experimental physics / 001B00G05P Image processing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79P Imaging detectors and sensors

Discipline
Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
24792061

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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