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Band excitation in scanning probe microscopy: sines of change

Author
JESSE, Stephen1 ; KALININ, Sergei V1
[1] The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
Issue title
Three decades of scanning tunnelling microscopy
Author (monograph)
RAMACHANDRA RAO, M. S (Editor)
Source

Journal of physics. D, Applied physics (Print). 2011, Vol 44, Num 46 ; 464006.1-464006.16 ; ref : 104 ref

CODEN
JPAPBE
ISSN
0022-3727
Scientific domain
Condensed state physics; Physics; Plasma physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Commutation ferroélectrique Domaine magnétique Formation image Fréquence résonance Microscopie champ proche Microscopie force magnétique Microscopie tunnel balayage Méthode étude Nanostructure Propriété thermique Propriété électrochimique
Keyword (en)
Ferroelectric switching Magnetic domains Imaging Resonance frequency Scanning probe microscopy Magnetic force microscopy Scanning tunneling microscopy Investigation method Nanostructures Thermal properties Electrochemical properties
Keyword (es)
Frecuencia resonancia Método estudio Propiedad electroquímica
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
24796642

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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