Computing inductive noise of CMOS drivers
- Author
- RAINAL, A. J1
[1] Bell Laboratories, Lucent Technologies, Murray Hill, NJ 07974, United States - Source
IEEE transactions on components, packaging, and manufacturing technology. Part B, Advanced packaging. 1996, Vol 19, Num 4, pp 789-802 ; ref : 19 ref
- ISSN
- 1070-9894
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Bruit Circuit intégré Encapsulation Interconnexion Modélisation Packaging Réduction bruit Réponse transitoire Technologie MOS complémentaire
- Keyword (en)
- Noise Integrated circuit Encapsulation Interconnection Modeling Electronic packaging Noise reduction Transient response Complementary MOS technology
- Keyword (es)
- Ruido Circuito integrado Encapsulación Interconexión Modelización Packaging Reducción ruido Respuesta transitoria Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2505166
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/96.544371 
https://dx.doi.org/10.1109/96.544371
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