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Multielectron processes in collisions of Xe23+ ions with Ar atoms

Autor
DING, B. W1 ; YU, D. Y2 ; SHAO, C. J2 3 ; LU, R. C2 ; RUAN, F. F2 ; LI, H. C1 ; ZHANG, W. J1 ; CAI, X. H2
[1] School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China
[2] Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China
[3] Graduate School of the Chinese Academy of Sciences, Beijing 100049, China
Fuente

The European physical journal. D, Atomic, molecular and optical physics (Print). 2011, Vol 65, Num 3, pp 391-396, 6 p ; ref : 22 ref

ISSN
1434-6060
Campo Científico
Optics; Atomic molecular physics
Editor
EDP Sciences, Les Ulis
País de la publicación
France
Tipo de documento
Article
Idioma
English
Palabra clave (fr)
Argon Atome Collision ion atome Ion multichargé Loi échelle Méthode mesure Méthode temps vol Section efficace Xénon Ion atomique 3450F Ar Xe ip 23
Palabra clave (in)
Argon Atoms Ion-atom collisions Multicharged ions Scaling laws Measuring methods Time-of-flight method Cross sections Xenon Atomic ions
Clasificación
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30D Atomic and molecular collision processes and interactions / 001B30D50 Scattering of atoms, molecules and ions / 001B30D50F Electronic excitation and ionization of atoms (including beam-foil excitation and ionization)

Disciplina
Atomic and molecular physics
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
25349808

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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