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Inducing novel electronic properties in (112) Ge nanowires by means of variations in their size, shape and strain: a first-principles computational study

Autor
CHAO ZHANG1 ; DE SARKAR, Abir1 ; ZHANG, Rui-Qin1
[1] Department of Physics and Materials Science, City University of Hong Kong, 83 Tat Chee Avenue, Hong Kong Special Administrative Region, Kowloon, Hong-Kong
Fuente

Journal of physics. Condensed matter (Print). 2012, Vol 24, Num 1 ; 015301.1-015301.8 ; ref : 72 ref

CODEN
JCOMEL
ISSN
0953-8984
Campo Científico
Crystallography; Metallurgy, welding; Condensed state physics
Editor
Institute of Physics, Bristol
País de la publicación
United Kingdom
Tipo de documento
Article
Idioma
English
Palabra clave (fr)
Bande interdite Bande valence Contrainte compression Contrainte traction Contrainte uniaxiale Densité charge Energie cohésion Facettage Germanium Méthode fonctionnelle densité Nanofil Structure bande Structure électronique
Palabra clave (in)
Energy gap Valence bands Compressive stress Tensile stress Uniaxial stress Charge density Cohesive energy Faceting Germanium Density functional method Nanowires Band structure Electronic structure
Palabra clave (es)
Tensión compresión Tensión traccíon Tensión uniaxial Facetage
Clasificación
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C22 Electronic structure of nanoscale materials : clusters, nanoparticles, nanotubes, and nanocrystals

Disciplina
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
25363524

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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