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Critical current density of Bi-2212 thick films processed by partial melting

Author
BUHL, D1 ; LANG, T1 ; GAUCKLER, L. J1
[1] ETH Zürich, Nonmetallic Materials, Sonneggstrasse 5, 8092 Zürich, Switzerland
Source

Superconductor science & technology (Print). 1997, Vol 10, Num 1, pp 32-40 ; ref : 38 ref

ISSN
0953-2048
Scientific domain
Electronics; Condensed state physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Atmosphère contrôlée Bismuth oxyde Calcium oxyde Composé minéral Composé n éléments Courant critique Cristallisation Cuivre oxyde Densification Dépendance température Epaisseur Etude expérimentale Film supraconducteur Ligne irréversibilité Préparation Recuit Strontium oxyde Supraconducteur haute température Traitement thermique Vitesse refroidissement
Keyword (en)
Controlled atmospheres Bismuth oxides Calcium oxides Inorganic compounds Multi-element compounds Critical currents Crystallization Copper oxides Densification Temperature dependence Thickness Experimental study Superconducting films Irreversibility line Preparation Annealing Strontium oxides High temperature superconductors Heat treatment Cooling rate
Keyword (es)
Preparación
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70D Superconductivity / 001B70D25 Properties of type I and type II superconductors / 001B70D25S Critical currents

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2548035

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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