X-ray Spectrometry : FUNDAMENTAL AND APPLIED REVIEWS IN ANALYTICAL CHEMISTRY
- Author
- TSUJI, Kouichi1 ; NAKANO, Kazuhiko1 ; TAKAHASHI, Yoshio2 ; HAYASHI, Kouichi3 ; RO, Chul-Un4
[1] Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, Osaka, 558-8585, Japan
[2] Department of Earth and Planetary Systems Science, Graduate School of Science, Hiroshima University, Higashi-Hiroshima, Hiroshima 739-8526, Japan
[3] Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, 980-8577, Japan
[4] Department of Chemistry, Inha University, 253 Yonghyun-dong, Nam-gu, Incheon, 402-751, Korea, Republic of - Source
Analytical chemistry (Washington). 2012, Vol 84, Num 2, pp 636-668, 33 p ; ref : 229 ref
- CODEN
- ANCHAM
- ISSN
- 0003-2700
- Scientific domain
- Analytical chemistry
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Spectrométrie RX
- Keyword (en)
- X ray spectrometry
- Keyword (es)
- Espectrometría RX
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 25482180
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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