Impact of the Surface Roughness Description on the Electrical Contact Resistance of Ohmic Switches Under Low Actuation Forces
- Author
- PENNEC, Fabienne1 ; PEYROU, David1 ; LERAY, Dimitri2 ; PONS, Patrick1 ; PLANA, Robert1 ; COURTADE, Frédéric3
[1] Laboratory of Analysis and Architecture of Systems, Centre National de la Recherche Scientifique, Toulouse University, Toulouse 31000, France
[2] Institut National des Sciences Appliquées of Toulouse, School of Engineering, Ministry of Education and Research, Toulouse 31077, France
[3] Centre National d'Etudes Spatiales, Centre spatial de Toulouse, Toulouse 31401, France - Source
IEEE transactions on components, packaging, and manufacturing technology (2011. Print). 2012, Vol 2, Num 1-2, pp 85-94, 10 p ; ref : 24 ref
- ISSN
- 2156-3950
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, Piscataway, NJ
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- ANSYS11 deterministic discretization step electrical contact resistance finite element method metal-to-metal contact radio frequency microelectromechanical switches roughness
- Keyword (fr)
- Basse tension Caractéristique électrique Commutateur Contact métal métal Contact électrique Dispositif microélectromécanique Effet surface Etat surface Evaluation performance Implémentation Modélisation Méthode numérique Méthode élément fini Radiofréquence Rugosité Résistance contact Résistance électrique Surcharge Surface rugueuse Système électromécanique Temps calcul Tension de commande Topographie surface
- Keyword (en)
- Low voltage Electrical characteristic Selector switch Metal metal contact Electric contact Microelectromechanical device Surface effect Surface conditions Performance evaluation Implementation Modeling Numerical method Finite element method Radiofrequency Roughness Contact resistance Resistor Overload Rough surface Electromechanical system Computation time Actuation voltage Surface topography
- Keyword (es)
- Baja tensión Característica eléctrica Conmutador Contacto metal metal Contacto eléctrico Dispositivo microelectromecánico Efecto superficie Estado superficie Evaluación prestación Implementación Modelización Método numérico Método elemento finito Radiofrecuencia Rugosidad Resistencia contacto Resistencia eléctrica(componente) Sobrecarga Superficie rugosa Sistema electromecánico Tiempo computación Voltaje de control
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F01 Interfaces
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F21 Micro- and nanoelectromechanical devices (mems/nems)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A7 Switching, multiplexing, switched capacity circuits
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 25512677
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TCPMT.2011.2108655 
https://dx.doi.org/10.1109/TCPMT.2011.2108655
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