A deep view in cultural heritage—confocal micro X-ray spectroscopy for depth resolved elemental analysis
- Author
- KANNGIESSER, B1 ; MALZER, W1 ; MANTOUVALOU, I1 ; SOKARAS, D2 ; KARYDAS, A. G2 3
[1] Institut für Optik und Atomare Physik, Technical University of Berlin, Sekr. EW 3-2, Raum 346. Hardenbergstr. 36, 10623 Berlin, Germany
[2] Institute of Nuclear Physics, NCSR 'Demokritos', 153 10 Athens, Greece
[3] Nuclear Spectrometry and Applications Laboratory (NSAL), International Atomic Energy Agency, 2400 Seibersdorf, Austria - Issue title
- Optical Technologies in Art and Archaeology
- Author (monograph)
- FOTAKIS, C (Editor)1
[1] Institute of Electronic Structure and Laser, FORTH - Foundation for Research and Technology - Hellas, P.O. Box 1527, Vassilika Vouton, 71110 Heraklion, Crete, Greece - Source
Applied physics. A, Materials science & processing (Print). 2012, Vol 106, Num 2, pp 325-338, 14 p ; ref : 72 ref
- ISSN
- 0947-8396
- Scientific domain
- Electronics; Optics; Condensed state physics
- Publisher
- Springer, Heidelberg
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse quantitative Analyse élémentaire Corrosion Céramique Email Emission RX Fluorescence RX Imagerie Lentille RX Microscopie RX Microsonde Méthode optique Optique RX Patrimoine culturel Peinture Rayonnement synchrotron Résolution spatiale Spectrométrie RX Verre 0785 4150 8170 Analyse PIXE Cartographie Patrimoine
- Keyword (en)
- Quantitative chemical analysis Elementary analysis Corrosion Ceramics Enamels X ray emission X ray fluorescence Imagery X-ray lens X-ray microscopy Microprobe Optical method X-ray optics Cultural heritage Paints Synchrotron radiation Spatial resolution X-ray spectroscopy Glass
- Keyword (es)
- Análisis elemental Emisión RX Fluorescencia RX Imaginería Microsonda Método óptico Patrimonio cultural
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40A Electromagnetism; electron and ion optics / 001B40A50 X-ray beams and x-ray optics
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing
- Discipline
- Metrology Physics : electromagnetism Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 25603705
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s00339-011-6698-0 
https://dx.doi.org/10.1007/s00339-011-6698-0
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