Control of levitation in electromagnetic levitators under microgravity
- Author
- MINAGAWA, H1 ; SUZUKI, Y1 ; KABURAGI, M4 ; IIDA, M4 ; NOGI, K5 ; KUDO, I6 ; KITAGAWA, S7 ; SUZUKI, N7 ; KAWABATA, J1 ; SHIMOKAWA, K1 ; UEDA, Y1 ; IWASAKI, S2 ; SHINOHARA, J2 ; UENO, H2 ; NISHIZAWA, E3 ; SAKURAI, H3
[1] Hokkaido National Industrial Research Institute, Agency of Industry and Science Technology, Ministry of International Trade and Industry, 2-17 Tsukisamu-Higashi, Toyohira-ku, Sapporo 062, Japan
[2] Ishikawa-jima Heavy Industry Company Co., Ltd., 2-1 Ohtemachi, Chiyoda-ku, Tokyo 100, Japan
[3] Ishikawa-jima Noise Control Co., Ltd., 1-15-18 Hyakunincho, Shinjuku-ku, Tokyo 169, Japan
[4] Industrial System Engineering Co., Ltd., 3-12-13 Takaidonishi, Suginami-ku, Tokyo 168, Japan
[5] Welding Research Institute, Osaka University, Mihogaoka, Ibaraki, Osaka 567, Japan
[6] Electrotechnical Laboratory, Agency of Industry and Science Technology, Ministry of International Trade and Industry, 1-1-4 Umezono, Tsukuba, Ibaraki 305, Japan
[7] Japan Space Utilization Promotion Center, 3-30-16 Nishiwaseda, Shinjuku-ku, Tokyo 169, Japan - Source
Japanese journal of applied physics. 1996, Vol 35, Num 12B, pp L1714-L1716 ; 2 ; ref : 9 ref
- CODEN
- JJAPA5
- ISSN
- 0021-4922
- Scientific domain
- Crystallography; Optics; Condensed state physics; Physics; Plasma physics
- Publisher
- Japanese journal of applied physics, Tokyo
- Publication country
- Japan
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composant électronique Etat fondu Etude expérimentale Lévitation Microgravité Méthode mesure Propriété thermophysique Silicium Suspension magnétique Système commande
- Keyword (en)
- Electronic component Molten state Experimental study Levitation Microgravity Measurement method Thermophysical properties Silicon Magnetic suspension Control system
- Keyword (es)
- Componente electrónico Estado fundido Estudio experimental Levitación Microgravidez Método medida Propiedad termofísica Silicio Suspensión magnética Sistema control
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2565131
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1143/JJAP.35.L1714 
https://dx.doi.org/10.1143/JJAP.35.L1714
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