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Control of levitation in electromagnetic levitators under microgravity

Author
MINAGAWA, H1 ; SUZUKI, Y1 ; KABURAGI, M4 ; IIDA, M4 ; NOGI, K5 ; KUDO, I6 ; KITAGAWA, S7 ; SUZUKI, N7 ; KAWABATA, J1 ; SHIMOKAWA, K1 ; UEDA, Y1 ; IWASAKI, S2 ; SHINOHARA, J2 ; UENO, H2 ; NISHIZAWA, E3 ; SAKURAI, H3
[1] Hokkaido National Industrial Research Institute, Agency of Industry and Science Technology, Ministry of International Trade and Industry, 2-17 Tsukisamu-Higashi, Toyohira-ku, Sapporo 062, Japan
[2] Ishikawa-jima Heavy Industry Company Co., Ltd., 2-1 Ohtemachi, Chiyoda-ku, Tokyo 100, Japan
[3] Ishikawa-jima Noise Control Co., Ltd., 1-15-18 Hyakunincho, Shinjuku-ku, Tokyo 169, Japan
[4] Industrial System Engineering Co., Ltd., 3-12-13 Takaidonishi, Suginami-ku, Tokyo 168, Japan
[5] Welding Research Institute, Osaka University, Mihogaoka, Ibaraki, Osaka 567, Japan
[6] Electrotechnical Laboratory, Agency of Industry and Science Technology, Ministry of International Trade and Industry, 1-1-4 Umezono, Tsukuba, Ibaraki 305, Japan
[7] Japan Space Utilization Promotion Center, 3-30-16 Nishiwaseda, Shinjuku-ku, Tokyo 169, Japan
Source

Japanese journal of applied physics. 1996, Vol 35, Num 12B, pp L1714-L1716 ; 2 ; ref : 9 ref

CODEN
JJAPA5
ISSN
0021-4922
Scientific domain
Crystallography; Optics; Condensed state physics; Physics; Plasma physics
Publisher
Japanese journal of applied physics, Tokyo
Publication country
Japan
Document type
Article
Language
English
Keyword (fr)
Composant électronique Etat fondu Etude expérimentale Lévitation Microgravité Méthode mesure Propriété thermophysique Silicium Suspension magnétique Système commande
Keyword (en)
Electronic component Molten state Experimental study Levitation Microgravity Measurement method Thermophysical properties Silicon Magnetic suspension Control system
Keyword (es)
Componente electrónico Estado fundido Estudio experimental Levitación Microgravidez Método medida Propiedad termofísica Silicio Suspensión magnética Sistema control
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2565131

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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