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The Application of Digital Image Techniques to Determine the Large Stress-Strain Behaviors of Soft Materials

Author
YOUGUN HAN1 ; ROGALSKY, Allan D1 ; BOXIN ZHAO2 ; HYOCK JU KWON1
[1] Department of Mechanical and Mechatronics Engineering, University of Waterloo, 200 University Avenue West, Waterloo, Ontario N2L 3G1, Canada
[2] Department of Chemical Engineering and Waterloo Institute for Nanotechnology, University of Waterloo, 200 University Avenue West, Waterloo, Ontario N2L 3G1, Canada
Source

Polymer engineering and science. 2012, Vol 52, Num 4, pp 826-834, 9 p ; ref : 43 ref

CODEN
PYESAZ
ISSN
0032-3888
Scientific domain
Polymers, paint and wood industries
Publisher
Wiley, Hoboken, NJ
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Méthode élément fini Polymère Propriété mécanique Relation contrainte déformation Siloxane élastomère Siloxane(diméthyl) polymère Simulation numérique
Keyword (en)
Finite element method Polymer Mechanical properties Stress strain relation Silicone elastomer Dimethylsiloxane polymer Numerical simulation
Keyword (es)
Método elemento finito Polímero Propiedad mecánica Relación tensión deformación Siloxano elastómero Siloxano(dimetil) polímero Simulación numérica
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D09 Physicochemistry of polymers

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D10 Polymer industry, paints, wood / 001D10A Technology of polymers

Discipline
Physical chemistry of polymers Polymer industry, paints, wood
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
25654248

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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