Pascal and Francis Bibliographic Databases

Help

Permanent link : http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=25697611

Export

Selection :

A comparative assessment of surface microstructure and electrical conductivity dependence on co-solvent addition in spin coated and inkjet printed poly(3,4-ethylenedioxythiophene):polystyrene sulphonate (PEDOT:PSS)

Author
WILSON, Peter1 ; LEKAKOU, Constantina1 ; WATTS, John F1
[1] Division of Mechanical, Medical, and Aerospace Engineering, Faculty of Engineering and Physical Sciences, University of Surrey, Guildford GU2 7XH, United Kingdom
Source

Organic electronics (Print). 2012, Vol 13, Num 3, pp 409-418, 10 p ; ref : 34 ref

ISSN
1566-1199
Scientific domain
Electronics; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
AFM Electrical conductivity Inkjet printing PEDOT:PSS Spin coating XPS
Keyword (fr)
Additif Agent surface Conductivité électrique Couche mince Dépôt centrifugation Effet concentration Impression à jet d'encre Microscopie force atomique Microstructure Mélange polymère Méthyle sulfoxyde Procédé fabrication Revêtement centrifugation Rugosité Résistivité couche Spectre photoélectron RX Spectrométrie RX Structure surface Styrène polymère Styrènesulfonate polymère Tension superficielle Thiophène dérivé polymère Valeur efficace
Keyword (en)
Additive Surfactant Electrical conductivity Thin film Spin-on coating Concentration effect Ink jet printing Atomic force microscopy Microstructure Polymer blends Methyl sulfoxide Manufacturing process Spin-on coatings Roughness Sheet resistivity X-ray photoelectron spectra X ray spectrometry Surface structure Styrene polymer Styrenesulfonate polymer Surface tension Thiophene derivative polymer Root mean square value
Keyword (es)
Aditivo Agente superficie Conductividad eléctrica Capa fina Efecto concentración Impresión por chorro de tinta Microscopía fuerza atómica Microestructura Sulfóxido de dimetilo Procedimiento fabricación Rugosidad Resistividad capa Espectrometría RX Estructura superficie Estireno polímero Estireno sulfonato polímero Tensión superficial Tiofeno derivado polímero Valor eficaz
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03C Materials

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
25697611

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Access to the document

Searching the Web