Integrity evaluation of SiOx film on polyethylene terapthalate by AE characterization and laser microscopy
- Author
- FUTATSUGI, T1 ; OGAWA, S1 ; TAKEMOTO, M1 ; YANAKA, M.-A2 ; TSUKAHARA, Y2
[1] Faculty of Science and Engineering, Aoyama Gakuin University 6-16-1, Chitose-dai, Setagaya, Tokyo, 157, Japan
[2] Technical Research Institute, Toppan Printing Co. Ltd, Sugitomachi, Kitakatsushika-gun, Saitama 345, Japan - Conference title
- Asia-Pacific Conference on Nondestructive Testing (APCNDT)
- Conference name
- Asia-Pacific Conference on Nondestructive Testing (APCNDT) (APCNDT) (8 ; Taipei 1995-12-11)
- Author (monograph)
- HU, Ching-Piao (Editor)1 2 ; WU, Tsung-Tsong (Editor)2 ; MA, Ching-Chien (Editor)2 3
[1] Atomic Energy Council of ROC, Taiwan, Province of China
[2] Institute of Applied Mechanics, National Taiwan University, Taiwan, Province of China
[3] Department of Mechanical Engineering, National Taiwan University, Taiwan, Province of China - Source
NDT & E international. 1996, Vol 29, Num 5, pp 307-316 ; ref : 18 ref
- ISSN
- 0963-8695
- Scientific domain
- Mechanical engineering
- Publisher
- Elsevier Science, Oxford
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Emission acoustique Ethylène téréphtalate polymère Interface solide solide Mécanique rupture Méthode essai Onde Lamb Propagation fissure Silicium oxyde
- Keyword (en)
- Acoustic emission Ethylene terephthalate polymer Solid-solid interfaces Fracture mechanics Test method Lamb wave Crack propagation Silicon oxides
- Keyword (es)
- Etileno tereftalato polímero Método ensayo Onda Lamb
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35G Mechanical and acoustical properties; adhesion
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2580016
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0963-8695(96)00034-5 
https://dx.doi.org/10.1016/S0963-8695(96)00034-5
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