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A comparison of neutron diffraction and hole-drilling residual strain measurements in thermally sprayed coatings

Author
AHMED, R1 2 ; FITZPATRICK, M. E3 ; FAISAL, N. H2
[1] School of EPS, Heriot-Watt University, Edinburgh EH14 4AS, United Kingdom
[2] College of Engineering, Alfaisal University, P.O. Box 50927, Riyadh 11533, Saudi Arabia
[3] Materials Engineering, The Open University, Milton Keynes MK7 6AA, United Kingdom
Source

Surface & coatings technology. 2012, Vol 206, Num 19-20, pp 4180-4185, 6 p ; ref : 28 ref

CODEN
SCTEEJ
ISSN
0257-8972
Scientific domain
General chemistry, physical chemistry; Metallurgy, welding
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
HIPing Hole-drilling Neutron diffraction Residual stress Thermal spray coating WC-NiCrBSi
Keyword (fr)
Contrainte résiduelle Diffraction neutron Déformation résiduelle Dépôt projection Perçage Projection à chaud Revêtement Traitement surface Trou Usinage
Keyword (en)
Residual stresses Neutron diffraction Residual strain Spray coatings Boring Hot spraying Coatings Surface treatments Holes Machining
Keyword (es)
Deformación residual Agujereamiento Proyección en caliente
Keyword (de)
Bohren Spritzen
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A65 Surface treatments

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11C Production techniques / 001D11C06 Surface treatment

Discipline
Metals. Metallurgy Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
25986534

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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