Reducing Thermal Hotspots in Multi-Core Processors using Core Migration Scheduling
- Author
- ERATNE, Savithra1 ; ROMO, Claudia1 ; JOHN, Eugene1 ; LIN, Wei-Ming1
[1] Department of Electrical and Computer Engineering University of Texas at San Antonio, San Antonio, Texas, United States - Conference title
- CDES 2011 : proceedings of the 2011 international conference on computer design (Las Vegas NV, July 18-21, 2011)
- Conference name
- Computer design. International conference (Las Vegas NV 2011-07-18) = WorldComp'2011 (Las Vegas NV 2011-07-18)
- Author (monograph)
- Arabnia, Hamid R (Editor); Solo, Ashu M.G (Editor)
- Source
CDES 2011 : proceedings of the 2011 international conference on computer design (Las Vegas NV, July 18-21, 2011). 2011, pp 125-130, 6 p ; ref : 15 ref
- ISBN
- 1-60132-173-2
- Scientific domain
- Electronics; Computer science
- Publisher
- CSREA Press, [S.l.]
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Champ température Circuit VLSI Circuit intégré Comportement thermique Consommation électricité Densité élevée Dissipation énergie Durabilité Evaluation performance Fiabilité Gestion température packaging électronique Grande puissance Microprocesseur Ordonnancement Processeur multicoeur Recherche et développement Temps retard Traitement parallèle Traitement réparti
- Keyword (en)
- Temperature distribution VLSI circuit Integrated circuit Thermal behavior Electric power consumption High density Energy dissipation Durability Performance evaluation Reliability Thermal management (packaging) High power Microprocessor Scheduling Multicore processor Research and development Delay time Parallel processing Distributed processing
- Keyword (es)
- Campo temperatura Circuito VLSI Circuito integrado Comportamiento térmico Consumo electricidad Densidad elevada Disipación energía Durabilidad Evaluación prestación Fiabilidad Gran potencia Microprocesador Reglamento Procesador MultiNúcleo Investigación desarrollo Tiempo retardo Tratamiento paralelo Tratamiento repartido
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03J Hardware / 001D03J10 Distributed computer systems
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 26051996
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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