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A Multimetal Surface Micromachining Process for Tunable RF MEMS Passives

Author
YONGHYUN SHIM1 ; ZHENGZHENG WU1 ; RAIS-ZADEH, Mina1
[1] Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109, United States
Source

Journal of microelectromechanical systems. 2012, Vol 21, Num 4, pp 867-874, 8 p ; ref : 39 ref

ISSN
1057-7157
Scientific domain
Electronics; Mechanics acoustics; Physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
High quality factor RF MEMS surface micromachining tunable passives ultra high frequency
Keyword (fr)
Accord fréquence Capacité électrique Commutateur Composant passif Condensateur Couche sacrificielle Dispositif microélectromécanique Haute performance Microusinage surface Mécanique précision Processus fabrication Radiofréquence Structure sandwich Système sur puce Technologie MOS complémentaire
Keyword (en)
Tuning Capacitance Switches Passive component Capacitors Sacrificial layer Microelectromechanical device High performance Surface micromachining Precision engineering Production process Radiofrequency Sandwich structures System on a chip Complementary MOS technology
Keyword (es)
Componente pasivo Capa sacrificial Dispositivo microelectromecánico Alto rendimiento Micromaquinado superficie Mecánica precisión Proceso fabricación Radiofrecuencia Tecnología MOS complementario
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G10 Mechanical instruments, equipment and techniques / 001B00G10C Micromechanical devices and systems

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
26195554

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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