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Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy

Autor
KOCH, S1 ; LANGER, M1 ; KAWAI, S1 ; MEYER, E1 ; GLATZEL, Th1
[1] Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland
Fuente

Journal of physics. Condensed matter (Print). 2012, Vol 24, Num 31 ; 314212.1-314212.9 ; ref : 44 ref

CODEN
JCOMEL
ISSN
0953-8984
Campo Científico
Crystallography; Metallurgy, welding; Condensed state physics
Editor
Institute of Physics, Bristol
País de la publicación
United Kingdom
Tipo de documento
Article
Idioma
English
Palabra clave (fr)
Contraste image Déformation élastique Energie liaison Interaction pointe surface Mesure sans contact Microscopie force atomique Microscopie tunnel balayage Nanoparticule Nitrure de bore Rhodium Sonde Kelvin Spectre photoélectron Structure surface Surstructure Travail sortie BN
Palabra clave (in)
Image contrast Elastic deformation Binding energy Tip surface interactions Non contact measurement Atomic force microscopy Scanning tunneling microscopy Nanoparticles Boron nitride Rhodium Kelvin probe Photoelectron spectra Surface structure Superstructure Work functions
Palabra clave (es)
Imagen contraste Medida sin contacto Boro nitruro Sonda Kelvin Superestructura
Clasificación
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A46 Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals

Disciplina
Physics of condensed state : structure, mechanical and thermal properties
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
26208618

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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