Correlation of reflection electron diffraction patterns, Raman spectra and compositions in CuInSe2 films
- Author
- IGARASHI, O1
[1] Electrotechnical Laboratory, 1-1-4 Umezono, Tsukuba, Ibaraki 305, Japan - Source
Journal of crystal growth. 1997, Vol 173, Num 1-2, pp 97-103 ; ref : 8 ref
- CODEN
- JCRGAE
- ISSN
- 0022-0248
- Scientific domain
- Crystallography; Geology; Metallurgy, welding
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse quantitative Composition chimique Composé ternaire Couche mince Couche épitaxique Cuivre séléniure Diagramme diffraction Diffraction électron Etude expérimentale Hétéroépitaxie Indium séléniure Matériau semiconducteur Orientation cristalline Spectre Raman Structure chalcopyrite Structure cristalline Cu In Se CuInSe2 Composé minéral Métal transition composé
- Keyword (en)
- Quantitative chemical analysis Chemical composition Ternary compounds Thin films Epitaxial layers Copper selenides Diffraction pattern Electron diffraction Experimental study Heteroepitaxy Indium selenides Semiconductor materials Crystal orientation Raman spectra Chalcopyrite structure Crystal structure Inorganic compounds Transition element compounds
- Keyword (es)
- Diagrama difracción Heteroepitaxia Estructura calcopirita
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55N Composition and phase identification
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2625584
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0022-0248(96)00798-1 
https://dx.doi.org/10.1016/S0022-0248(96)00798-1
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