Cooling rate determination of Si samples in a radiative quench and observation of an apparent temperature shift of the 1 x 1-7 x 7 surface phase transition
- Author
- KULAKOV, M. A1 ; HOSTER, H1 ; ZHANG, Z1 ; BULLEMER, B1
[1] Universität der Bundeswehr München, Fakultät für Elektrotechnik, Institut für Physik, 85577 Neubiberg, Germany - Source
Surface science. 1997, Vol 376, Num 1-3, pp L414-L418 ; ref : 6 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Etude expérimentale Silicium Structure surface Transformation phase Trempe Si
- Keyword (en)
- Experimental study Silicon Surface structure Phase transformations Quenching
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35R Phase transitions and critical phenomena
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2627859
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0039-6028(96)01589-0 
https://dx.doi.org/10.1016/S0039-6028(96)01589-0
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