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Cooling rate determination of Si samples in a radiative quench and observation of an apparent temperature shift of the 1 x 1-7 x 7 surface phase transition

Author
KULAKOV, M. A1 ; HOSTER, H1 ; ZHANG, Z1 ; BULLEMER, B1
[1] Universität der Bundeswehr München, Fakultät für Elektrotechnik, Institut für Physik, 85577 Neubiberg, Germany
Source

Surface science. 1997, Vol 376, Num 1-3, pp L414-L418 ; ref : 6 ref

CODEN
SUSCAS
ISSN
0039-6028
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics; Polymers, paint and wood industries
Publisher
Elsevier Science, Amsterdam / Elsevier Science, Lausanne / Elsevier Science, New York, NY
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Etude expérimentale Silicium Structure surface Transformation phase Trempe Si
Keyword (en)
Experimental study Silicon Surface structure Phase transformations Quenching
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35R Phase transitions and critical phenomena

Pacs
6835B Surface structure and topography

Pacs
6835R Phase transitions and critical phenomena

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2627859

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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