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Light-Induced Hysteresis of In-Ga-Zn-O Thin-Film Transistors With Various Temperatures

Author
KUK, Seung-Hee1 ; LEE, Soo-Yeon1 ; KIM, Sun-Jae1 ; KIM, Binn2 3 ; PARK, Soo-Jeong3 ; KWON, Jang-Yeon4 ; HAN, Min-Koo1
[1] School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea, Republic of
[2] School of Electrical Engineering, Seoul National University, Seoul 151-742, Korea, Republic of
[3] Research and Development Center, LG Display, Paju 413-811, Korea, Republic of
[4] School of Integrated Technology, Yonsei University, Inchoen 406-840, Korea, Republic of
Source

IEEE electron device letters. 2012, Vol 33, Num 9, pp 1279-1281, 3 p ; ref : 12 ref

CODEN
EDLEDZ
ISSN
0741-3106
Scientific domain
Electronics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Author keyword
Amorphous In―Ga―Zn―O thin-film transistors (a-IGZO TFTs) hysteresis light response
Keyword (fr)
Couche active Diélectrique Eclairement Lacune Matériau amorphe Oxygène Sous bande Transistor couche mince Zinc
Keyword (en)
Active layer Dielectric materials Illumination Vacancy Amorphous material Oxygen Subband Thin film transistor Zinc
Keyword (es)
Capa activa Dieléctrico Alumbrado Cavidad Material amorfo Oxígeno Subbanda Transistor capa delgada Zinc
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
26323409

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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