Measurements of thermophysical properties of molten silicon by a high-temperature electrostatic levitator
- Author
- RHIM, W. K1 ; CHUNG, S. K1 ; RULISON, A. J1 ; SPJUT, R. E2
[1] Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, California 91109, United States
[2] Department of Engineering, Harvey Mudd College, Claremont, California 91711, United States - Conference title
- Asian Thermophysical Properties Conference
- Conference name
- Asian Thermophysical Properties Conference (4 ; Tokyo 1995-11-05)
- Author (monograph)
- NAGASHIMA, Akira (Editor)1 ; ARAKI, Nobuyuki (Editor)2
[1] Keio University, Yokohama 223, Japan
[2] Shizuoka University, Hamamatsu 432, Japan - Source
International journal of thermophysics. 1997, Vol 18, Num 2, pp 459-469 ; ref : 12 ref
- Publisher
- Springer, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Chaleur massique Densité Dépendance température Emissivité Etat fondu Etude expérimentale Lévitation Méthode mesure Propriété thermophysique Silicium Tension superficielle Si
- Keyword (en)
- Specific heat Density Temperature dependence Emissivity Melts Experimental study Levitation Measuring methods Thermophysical properties Silicon Surface tension
- Keyword (es)
- Propiedad termofísica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60E Thermal properties of condensed matter / 001B60E40 Thermal properties of crystalline solids
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20C Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
- Pacs
- 7820C Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2653826
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/BF02575175 
https://dx.doi.org/10.1007/BF02575175
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