A 1.4-μW 24.9-ppm/°C Current Reference With Process-Insensitive Temperature Compensation in 0.18-μm CMOS
- Author
- LEE, Junghyup1 ; CHO, Seonghwan2
[1] Institute of Microelectronics, Singapore 117685, Singapore
[2] Department of Electrical Engineering, KAIST, Daejeon 305-701, Korea, Republic of - Source
IEEE journal of solid-state circuits. 2012, Vol 47, Num 10, pp 2527-2533, 7 p ; ref : 12 ref
- CODEN
- IJSCBC
- ISSN
- 0018-9200
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- CMOS current reference low power low supply voltage process-insensitive temperature compensation
- Keyword (fr)
- Basse tension Coefficient température Compensation thermique Courant intense Electronique faible puissance Implémentation Résistance électrique Technologie MOS complémentaire Référence de courant
- Keyword (en)
- Low voltage Temperature coefficient Thermal compensation High strength current Low-power electronics Implementation Resistor Complementary MOS technology Current reference
- Keyword (es)
- Baja tensión Coeficiente temperatura Compensación térmica Corriente intensa Implementación Resistencia eléctrica(componente) Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 26544298
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JSSC.2012.2204475 
https://dx.doi.org/10.1109/JSSC.2012.2204475
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