The hydrogen electrode in the dry: A Kelvin probe approach to measuring hydrogen in metals
- Author
- EVERS, S1 ; ROHWERDER, M1
[1] Christian-Doppler Laboratory for Diffusion and Segregation Phenomena, Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf, Germany - Source
Electrochemistry communications. 2012, Vol 24, pp 85-88, 4 p ; ref : 13 ref
- ISSN
- 1388-2481
- Scientific domain
- General chemistry, physical chemistry; Energy
- Publisher
- Elsevier, Amsterdam
/
Elsevier, Lausanne
/
Elsevier, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Devanathan-Stachurski Hydrogen detection Hydrogen electrode Palladium Permeation Scanning Kelvin probe
- Keyword (fr)
- Electrode hydrogène Hydrogène Palladium Perméabilité gaz Sonde Kelvin Travail sortie Métal transition Platinoïde
- Keyword (en)
- Hydrogen electrode Hydrogen Palladium Gas permeability Kelvin probe Work function Transition metal Platinoid
- Keyword (es)
- Electrodo hidrógeno Hidrógeno Paladio Permeabilidad gas Sonda Kelvin Función de trabajo Metal transición Platinoide
- Keyword (de)
- Wasserstoff Palladium Gasdurchlaessigkeit Austrittsarbeit Uebergangsmetalle Platinmetalle
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11H Analysing. Testing. Standards / 001D11H02 Nondestructive testing / 001D11H02B Measurement of properties and materials state
- Discipline
- Metals. Metallurgy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 26561837
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.elecom.2012.08.019 
https://dx.doi.org/10.1016/j.elecom.2012.08.019
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