Influence of Wire Parameters on Critical Current Versus Strain Characteristics of Bronze Processed Nb3 Sn Superconducting Wires
- Author
- MIYATAKE, Takayuki1 ; MURAKAMI, Yukinobu1 ; KURAHASHI, Hidefumi1 ; HAYASHI, Seiji1 ; ZAITSU, Kyoji2 ; SEEBER, Bernd3 ; MONDONICO, Giorgio3 ; NABARA, Yoshihiro4
[1] Japan Superconductor Technology, Inc., 800-0007 Fukuoka, Japan
[2] Electronics Research Laboratory, Kobe Steel, Ltd., 651-2271 Hyogo, Japan
[3] Department of Applied Physics, University of Geneva, 1211 Geneva, Switzerland
[4] Japan Atomic Energy Agency, 311-0193 Ibaraki, Japan - Conference title
- The Twenty-First International Conference on Magnet Technology
- Conference name
- International Conference on Magnet Technology (22 ; Marseille 2011-09-12)
- Author (monograph)
- IEEE Institute of Electrical and Electronics Engineers, United States (Organiser of meeting)
- Source
IEEE transactions on applied superconductivity. 2012, Vol 22, Num 3 ; 4805005.1-4805005.5 ; ref : 16 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Critical current density niobium-tin superconducting materials
- Keyword (fr)
- Champ critique Contrainte compression Courant critique Densité courant critique Epaisseur Evaluation performance Fil supraconducteur Matériau barrière Réacteur fusion nucléaire Supraconducteur Tokamak ITER Traitement thermique
- Keyword (en)
- Critical field Compressive stress Critical current Critical current density Thickness Performance evaluation Superconducting wires Barrier material Nuclear fusion reactor Superconducting materials ITER tokamak Heat treatment
- Keyword (es)
- Campo crítico Tensión compresión Corriente crítica Densidad corriente crítica Espesor Evaluación prestación Material barrera Reactor fusión nuclear Supraconductor Tratamiento térmico
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03C Materials
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05C Materials
- Discipline
- Electrical engineering. Electroenergetics Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 26646127
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TASC.2011.2179697 
https://dx.doi.org/10.1109/TASC.2011.2179697
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