ToF-SIMS analysis of biomolecules in the model organism Caenorhabditis elegans
- Author
- GEIER, Florian M1 ; FEARN, Sarah2 ; BUNDY, Jacob G1 ; MCPHAIL, David S2
[1] Biomolecular Medicine, Department of Surgery and Cancer, Faculty of Medicine, South Kensington Campus, Imperial College London, London SW7 2AZ, United Kingdom
[2] Department of Material Sciences, Faculty of Engineering, South Kensington Campus, Imperial College London, London SW7 2AZ, United Kingdom - Conference title
- Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18-23, 2011
- Conference name
- Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII (18 ; Trento 2011-09-18)
- Author (monograph)
- SIMS Italian Workgroup, Italy (Organiser of meeting)
The Fondazione Bruno Kessler, Trento, Italy (Organiser of meeting) - Source
Surface and interface analysis. 2013, Vol 45, Num 1, pp 234-236, 3 p ; ref : 10 ref
- CODEN
- SIANDQ
- ISSN
- 0142-2421
- Scientific domain
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Author keyword
- C.elegans ToF-SIMS imaging metabolomics
- Keyword (fr)
- Diffraction RX Diffusion anomale Etalonnage Formation image Microscopie optique Métal transition Méthode temps vol Or Résolution spatiale SIMS Structure fine Au
- Keyword (en)
- XRD Anomalous scattering Calibration Imaging Optical microscopy Transition elements Time-of-flight method Gold Spatial resolution SIMS Fine structure
- Keyword (es)
- Difusión anómala
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20R Atomic, molecular, and ion beam impact and interactions with surfaces
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 26875380
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/sia.5110 
https://dx.doi.org/10.1002/sia.5110
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