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Structural stability and electronic properties of LaO- and NiO2-terminated LaNi03 (001) surface

Author
LI GUAN1 2 ; JINGAI ZUO1 ; GUOQI JIA1 ; QINGBO LIU1 ; WEI WEI1 ; JIANXIN GUO1 ; XIUHONG DAI1 ; BAOTING LIU1 ; YINGLONG WANG1 ; GUANGSHENG FU1
[1] College of Physical Science and Technology, Hebei University, Baoding 071002, China
[2] Hebei Provincial Key Laboratory of Optic-Electronic Information Materials, Hebei University, Baoding 071002, China
Source

Applied surface science. 2013, Vol 264, pp 570-573, 4 p ; ref : 37 ref

ISSN
0169-4332
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Electronic structure First principle LaO- and NiO2-terminated Nickelate Surface
Keyword (fr)
Stabilité structurale Structure électronique
Keyword (en)
Structure stability Electronic structure
Keyword (es)
Estabilidad estructural
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
26899999

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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