Computer modeling of morphological evolution and RHEED intensity oscillations of thin-film growth by laser molecular beam epitaxy
- Author
- JIN, K.-J1 ; PAN, S.-H1 ; YANG, G.-Z1
[1] Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China - Source
Surface science. 1997, Vol 380, Num 2-3, pp 522-529 ; ref : 12 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Couche mince Croissance film Epitaxie jet moléculaire Etude théorique Morphologie Méthode Monte Carlo RHEED
- Keyword (en)
- Thin films Film growth Molecular beam epitaxy Theoretical study Morphology Monte Carlo method RHEED
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15H Molecular, atomic, ion, and chemical beam epitaxy
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2712206
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0039-6028(97)00034-4 
https://dx.doi.org/10.1016/S0039-6028(97)00034-4
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