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Ab initio study the effects of Si and Mg dopants on point defects and Y diffusion in YAG

Author
SHENGLI JIANG1 2 ; TIECHENG LU1 ; JUN CHEN2 3
[1] Department of Physics and Key Laboratory for Radiation Physics and Technology of Ministry of Education, Sichuan University, Chengdu 610064, China
[2] Institute of Applied Physics and Computational Mathematics, Beijing 100088, China
[3] Center for Applied Physics and Technology, Peking University, Beijing 100871, China
Source

Computational materials science. 2013, Vol 69, pp 261-266, 6 p ; ref : 36 ref

ISSN
0927-0256
Scientific domain
Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Point defects Si and Mg doping Y diffusion Y3Al5O12
Keyword (fr)
Addition magnésium Addition silicium Autodiffusion Calcul ab initio Chaleur formation Densité charge Dopage Défaut ponctuel Formation défaut Frittage Grenat aluminium yttrium Lacune Méthode fonctionnelle densité Sous réseau Y3Al5O12
Keyword (en)
Magnesium additions Silicon additions Self-diffusion Ab initio calculations Heat of formation Charge density Doping Point defects Defect formation Sintering YAG Vacancies Density functional method Sublattices
Keyword (es)
Doping Formación defecto
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72J Point defects (vacancies, interstitials, color centers, etc.) and defect clusters

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60F Transport properties of condensed matter (nonelectronic) / 001B60F30 Diffusion in solids / 001B60F30H Self-diffusion and ionic conduction in nonmetals

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27158173

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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