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The effect of built-in field on the interface exciton recombination and dissociation in N―N type organic solar cells

Author
TING ZHANG1 2 ; JUNHUA HUANG1 2 ; FU HE1 2 ; LIJIA CHEN1 2 ; GUOXI NIU1 2 ; JING PAN1 2 ; QUNLIANG SONG1 2
[1] Chongqing Key Laboratory for Advanced Materials & Technologies of Clean Energy, Chongqing 400715, China
[2] Institute for Clean Energy & Advanced Materials and School of Physical Science & Technology, Southwest University, Chongqing 400715, China
Source

Solar energy materials and solar cells. 2013, Vol 112, pp 73-77, 5 p ; ref : 31 ref

ISSN
0927-0248
Scientific domain
General chemistry, physical chemistry; Energy
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Built-in electric field Exciton dissociation Exciton recombination Organic solar cells
Keyword (fr)
Cellule solaire organique Champ électrique Courant photoélectrique Exciton Fullerènes Génération porteur charge Intensité lumineuse Porteur libre Semiconducteur type n C60
Keyword (en)
Organic solar cells Electric field Photoelectric current Exciton Fullerenes Charge carrier generation Luminous intensity Free carrier n type semiconductor
Keyword (es)
Campo eléctrico Corriente fotoeléctrica Excitón Generación portador carga Intensidad luminosa Portador libre Semiconductor tipo n
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D06 Energy / 001D06C Natural energy / 001D06C02 Solar energy / 001D06C02D Photovoltaic conversion / 001D06C02D1 Solar cells. Photoelectrochemical cells

Discipline
Energy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27165474

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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