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Nonlinear dynamics of two particles in the rf trap

Author
HASEGAWA, T1 ; UEHARA, K1
[1] Department of Physics, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223, Japan
Conference title
Proceedings of the Todai 1995 International Symposium and the 5th ISSP International Symposium on Frontiers in Lasers Physics and Spectroscopy
Conference name
ISSP International Symposium on Frontiers in Laser Physics and Spectroscopy (5 ; Tokyo 1995-11-08) = Todai 1995 International Symposium on Frontiers in Laser Physics and Spectroscopy (Tokyo 1995-11-08)
Author (monograph)
WATANABE, S (Editor)1
University of Tokyo ; Institute for Solid State Physics, Japan (Funder/Sponsor)
[1] Institute for Solid State Physics, University of Tokyo, Japan
Source

Progress in crystal growth and characterization of materials. 1996, Vol 33, Num 1-3, pp 401-404 ; ref : 9 ref

ISSN
0960-8974
Scientific domain
Crystallography
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Keyword (fr)
Dynamique Développement série Etude théorique Phénomène non linéaire Piège ion Système RF Série Fourier Transition phase
Keyword (en)
Dynamics Series expansion Theoretical study Non linear phenomenon Ion trap RF systems Fourier series Phase transitions
Keyword (es)
Fenómeno no lineal Trampa ión Serie Fourier Transición fase
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30G Mechanical control of atoms, molecules and ions / 001B30G20 Atomic and molecular beam sources and techniques

Discipline
Atomic and molecular physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2723337

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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