The Thermal Voltage Fluctuations in the Planar Core-Coat Conductor of a Neuron-Semiconductor Interface
- Author
- ZEITLER, Ralf1 ; FROMHERZ, Peter1
[1] Department of Membrane and Neurophysics, Max Planck Institute for Biochemistry, Am Klopferspitz 18, 82152 Martinsried-München, Germany - Source
Langmuir. 2013, Vol 29, Num 20, pp 6084-6090, 7 p ; ref : 28 ref
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Fluctuation Interface Semiconducteur
- Keyword (en)
- Fluctuations Interface Semiconductor materials
- Keyword (es)
- Fluctuación Interfase Semiconductor(material)
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01I Surface physical chemistry
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27401381
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/la4002169 
https://dx.doi.org/10.1021/la4002169
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