The effect of 200 MeV Ag ions on the transport property of yttrium barium copper oxide/silver composite thin film
- Author
- KUJUR, A1 ; ASOKAN, K2 ; BEHERA, D1
[1] Department of Physics, National Institute of Technology, Rourkela-769 008, India
[2] Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi-110 067, India - Source
Thin solid films. 2013, Vol 536, pp 256-260, 5 p ; ref : 30 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Critical current density Flux pinning Pinning centre Swift heavy ion YBCO
- Keyword (fr)
- Aimantation Amorphisation Ancrage Argent Baryum Cuivre Yttrium Oxyde Mixte Couche mince Densité courant critique Diffraction RX Dépôt laser pulsé Effet rayonnement Film complexe Formation défaut Microstructure Méthode ablation laser Propriété transport Spectrométrie Raman Supraconducteur haute température 6180 6855J 8115F Cuprate d'yttrium et de baryum Substrat argent YBa2Cu3O7-x YBaCuO
- Keyword (en)
- Magnetization Amorphization Pinning Silver Barium Copper Yttrium Oxides Mixed Thin films Critical current density XRD Pulsed laser deposition Radiation effects Composite film Defect formation Microstructure Laser ablation technique Transport properties Raman spectroscopy High-Tc superconductors
- Keyword (es)
- Mixto Densidad corriente crítica Película compleja Formación defecto Propiedad transporte
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A80 Physical radiation effects, radiation damage
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15F Laser deposition
- Discipline
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27434188
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2013.03.089 
https://dx.doi.org/10.1016/j.tsf.2013.03.089
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