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Noninvasive Spatial Metrology of Single-Atom Devices

Author
MOHIYADDIN, Fahd A1 ; RAHMAN, Rajib2 ; KALRA, Rachpon1 ; KLIMECK, Gerhard3 ; HOLLENBERG, Lloyd C. L4 ; PLA, Jarryd J1 ; DZURAK, Andrew S1 ; MORELLO, Andrea1
[1] Centre for Quantum Computation and Communication Technology, School of Electrical Engineering and Telecommunications, University of New South Wales, Sydney NSW 2052, Australia
[2] Advanced Device Technologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, United States
[3] Network for Computational Nanotechnology, Purdue University, West Lafayette, Indiana 47907, United States
[4] Centre for Quantum Computation and Communication Technology, School of Physics, University of Melbourne, Melbourne VIC 3010, Australia
Source

Nano letters (Print). 2013, Vol 13, Num 5, pp 1903-1909, 7 p ; ref : 38 ref

ISSN
1530-6984
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
American Chemical Society, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Atome unique Electrode commande Etat fondamental Etude théorique Implantation ion Mesure électrique Modélisation Métrologie Nanostructure Phosphore Silicium Tellurure de gallium Transistor 6865 8535 8565 Qubit Si
Keyword (en)
Single atom Gates Ground states Theoretical study Ion implantation Electrical measurement Modelling Metrology Nanostructures Phosphorus Silicon Gallium tellurides Transistors Qubit
Keyword (es)
Atomo único Medida eléctrica Qubit
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F18 Molecular electronics, nanoelectronics

Discipline
Electronics Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27439284

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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