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The München scanning positron microscope

Author
KÖGEL, G1
SPM-Group
[1] Institut für Nukleare Festkörperphysik, Universität der Bundeswehr München, 85577 Munich, Germany
Conference title
SLOPOS-7 International Workshop on Slow-Positron Beam Techniques for Solids and Surfaces
Conference name
SLOPOS-7 International Workshop on Slow-Positron Beam Techniques for Solids and Surfaces (7 ; Unterägeri 1996-06-02)
Author (monograph)
WAEBER, W. B (Editor)1 ; SHI, M (Editor)1 ; MANUEL, A. A (Editor)1
[1] Paul Scherrer Institute, Villigen, Switzerland
Source

Applied surface science. 1997, Vol 116, pp 108-113 ; ref : 9 ref

ISSN
0169-4332
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Essai non destructif Etude expérimentale Faisceau positon Faisceau pulsé Microscope balayage Microscope positon balayage
Keyword (en)
Nondestructive testing Experimental study Positron beams Pulsed beam Scanning microscope Scanning positron microscope
Keyword (es)
Haz pulsado Microscopio barrido
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques

Pacs
0778 Electron, positron, and ion microscopes, electron diffractometers, and related techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2751227

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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