The Distribution and Transport of Alpha Activity in Tin
- Author
- CLARK, Brett M1
[1] Honeywell Electronic Materials, Spokane, Washington 99216, United States - Source
Journal of microelectronics and electronic packaging. 2013, Vol 10, Num 2, pp 73-79, 7 p ; ref : 13 ref
- ISSN
- 1551-4897
- Scientific domain
- Electronics
- Publisher
- International Microelectronics and Packaging Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Alpha emissivity microsegregation polonium diffusion soft errors
- Keyword (fr)
- Emetteur Emissivité Erreur soft Fiabilité Packaging électronique Polonium Puce à bosses
- Keyword (en)
- Transmitter Emissivity Soft error Reliability Electronic packaging Polonium Flip-chip
- Keyword (es)
- Emisor Emisividad Error soft Fiabilidad Packaging electrónico Polonio
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27516615
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.4071/imaps.361 
https://dx.doi.org/10.4071/imaps.361
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