Stress induced leakage current generated by hot-hole injection
- Author
- TERAMOTO, Akinobu1 ; PARK, Hyeonwoo2 ; INATSUKA, Takuya2 ; KURODA, Rihito2 ; SUGAWA, Shigetoshi1 2 ; OHMI, Tadahiro1
[1] New Industry Creation Hatchery Center, Tohoku University, 6-6-10 Aza-Aoba, Aramaki, Aoba-ku, Sendai, Japan
[2] Graduate School of Engineering, Tohoku University, 6-6-11 Aza-Aoba, Aramaki, Aoba-ku, Sendai, Japan - Issue title
- Insulating Films on Semiconductors 2013
- Author (monograph)
- MAJKUSIAK, Bogdan (Editor)1 ; LUKASIAK, Lidia (Editor)2
[1] Warsaw University of Technology, Poland
[2] National Center for Scientific Research 'Demokritos', Greece - Source
Microelectronic engineering. 2013, Vol 109, pp 298-301, 4 p ; ref : 13 ref
- CODEN
- MIENEF
- ISSN
- 0167-9317
- Scientific domain
- Electronics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Hole MOSFET Stress induced leakage current Tunnel oxide
- Keyword (fr)
- Circuit intégré Contrainte électrique Courant fuite Densité trou Effet contrainte Effet tunnel Injection porteur charge Loi échelle Mémoire flash Méthode moyenne Technologie MOS Transistor MOSFET Trou 8530T Mémoire non volatile
- Keyword (en)
- Integrated circuit Electric stress Leakage current Hole density Stress effects Tunnel effect Charge carrier injection Scaling law Flash memory Averaging method MOS technology MOSFET Hole Non volatile memory
- Keyword (es)
- Circuito integrado Tensión eléctrica Corriente escape Densidad huecos Efecto túnel Inyección portador carga Ley escala Memoria flash Método medio Tecnología MOS Hoyo Memoria no volátil
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27516710
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.mee.2013.03.116 
https://dx.doi.org/10.1016/j.mee.2013.03.116
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