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The Structure, Performance and Recovery Time of a 10 kV Resistive Type Superconducting Fault Current Limiter

Author
HONG, Z1 ; SHENG, J1 ; YAO, L1 ; GU, J1 ; JIN, Z1
[1] Key Laboratory of Control of Power Transmission and Conversion, Ministry of Education and the Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China
Conference title
THE 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE Portland, OR, USA, October 7-12, 2012 LARGE SCALE
Conference name
The 2012 Applied Superconductivity Conference (Portland, OR 2012-10-07)
Author (monograph)
Institute of Electrical and Electronics Engineers (IEEE), New York, NY, United States (Organiser of meeting)
Source

IEEE transactions on applied superconductivity. 2013, Vol 23, Num 3 ; 56013.1-56013.4 ; 2 ; ref : 9 ref

ISSN
1051-8223
Scientific domain
Electronics; Electrical engineering
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Author keyword
Quench YBCO coated conductor recovery time under load superconducting fault current limiter
Keyword (fr)
Appareillage essai Chute tension Conducteur électrique Court circuit Cryostat Dispositif protection Dispositif supraconducteur Défaut monophasé En parallèle Evaluation performance Limiteur courant défaut Limiteur courant Matériau revêtu Prototype Prévention dommage Restauration (propriété) Stabilité réseau électrique Stabilité tension Temps rétablissement
Keyword (en)
Testing equipment Voltage fall Electrical conductor Short circuit Cryostat Protective device Superconductor device Single phase fault Parallel Performance evaluation Fault current limiters Current limiter Coated material Prototype Damage prevention Recovery (properties) Power system stability Voltage stability Recovery time
Keyword (es)
Aparato ensayo Caída tensión Conductor eléctrico Cortocircuito Criostato Dispositivo protección Dispositivo supraconductor Defecto monofase En paralelo Evaluación prestación Limitador corriente Material revestido Prototipo Prevención daño Restauración (propiedad) Estabilidad tensión Tiempo restablecimiento
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05B Testing. Reliability. Quality control

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05F Connection and protection apparatus

Discipline
Electrical engineering. Electroenergetics Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27529613

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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