The Structural Evolution of (Gd, Y)Ba2Cu3Ox Tapes With Zr Addition Made by Metal Organic Chemical Vapor Deposition
- Author
- CHANGHUI LEI1 ; GALSTYAN, Eduard2 ; YIMIN CHEN1 ; TUO SHI2 ; YUHAO LIU2 ; KHATRI, Narayan2 ; JINGFU LIU2 ; XUMING XIONG1 ; MAJKIC, Goran2 ; SELVAMANICKAM, Venkat2
[1] SuperPower Inc, Schenectady, NY 12304, United States
[2] Department of Mechanical Engineering and Texas Center for Superconductivity, University of Houston, Houston, TX 77204, United States - Conference title
- THE 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE Portland, OR, USA, October 7-12, 2012 MATERIALS
- Conference name
- The 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE (Portland, OR 2012-10-07)
- Author (monograph)
- Institute of Electrical and Electronics Engineers (IEEE), New York, NY, United States (Organiser of meeting)
- Source
IEEE transactions on applied superconductivity. 2013, Vol 23, Num 3 ; 66024.1-66024.4 ; 3 ; ref : 10 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- 2G high-temperature superconductor (HTS) Metal organic chemical vapor deposition (MOCVD) microstructure pinning effect transmission electron microscopy (TEM)
- Keyword (fr)
- Analyse structurale Autoassemblage Calcul construction Couche mince Diffraction RX Dopage Dépôt chimique phase vapeur Effet Meissner Epaisseur Fabrication microélectronique Matériau dopé Microscopie électronique transmission Microstructure Méthode MOCVD Nanocolonne Revêtement Supraconducteur haute température Technologie planaire
- Keyword (en)
- Structural analysis Self assembly Structural design Thin film X ray diffraction Doping Chemical vapor deposition Meissner effect Thickness Microelectronic fabrication Doped materials Transmission electron microscopy Microstructure MOCVD Nanocolumn Coatings High temperature superconductor Planar technology
- Keyword (es)
- Análisis estructural Autoensamble Cálculo construcción Capa fina Difracción RX Doping Depósito químico fase vapor Efecto Meissner Espesor Fabricación microeléctrica Microscopía electrónica transmisión Microestructura Nanocolumna Revestimiento Supraconductor alta temperatura Tecnología planar
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27529724
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TASC.2013.2243193 
https://dx.doi.org/10.1109/TASC.2013.2243193
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