The Optimal Growth of Single Grain Bulk Y-Ba-Cu-O Superconductors With Nd-Ba-Cu-O Thin Film Seed
- Author
- YANG, Chia-Ming1 ; WANG, Shang-Yu1 ; HUANG, Yi-Chang1 ; CHEN, Po-Wei1 ; CHEN, In-Gann1 ; WU, Maw-Keun2
[1] Department of Materials Science and Engineering, National Cheng-Kung University, Tainan, Taiwan, Province of China
[2] Institute of Physics, Academia Sinica, Taipei, Taiwan, Province of China - Conference title
- THE 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE Portland, OR, USA, October 7-12, 2012 MATERIALS
- Conference name
- The 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE (Portland, OR 2012-10-07)
- Author (monograph)
- Institute of Electrical and Electronics Engineers (IEEE), New York, NY, United States (Organiser of meeting)
- Source
IEEE transactions on applied superconductivity. 2013, Vol 23, Num 3 ; 68002.1-68002.4 ; 3 ; ref : 14 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Superconductor TSMG YBCO thin film seeded
- Keyword (fr)
- Couche mince Epitaxie Gestion température packaging électronique Morphologie Nucléation Phase liquide Refroidissement Régime optimal Soudage Supraconducteur Surchauffe Système coordonnée Système refroidissement
- Keyword (en)
- Thin film Epitaxy Thermal management (packaging) Morphology Nucleation Liquid phase Cooling Optimal conditions Welding Superconducting materials Superheating Coordinate system Cooling system
- Keyword (es)
- Capa fina Epitaxia Morfología Nucleación Fase líquida Enfriamiento Régimen óptimo Soldadura Supraconductor Sobrecalentamiento Sistema coordenadas Sistema enfriamiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27529733
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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