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Influence of Various Voltage Leads on AC Loss Measurement in a Double Layer BSCCO Conductor

Author
RYU, K1 ; LI, Z. Y2 ; MA, Y. H3 ; HWANG, S. D4
[1] Department of Electrical Engineering, Chonnam National University, Kwangju 500-757, Korea, Republic of
[2] Shanghai Jiao Tong University, Shanghai 200240, China
[3] Department of Electrical Engineering, School of IoT, Jiangnan University, Wuxi 214122, China
[4] Korea Electric Power Research Institute, Daejeon 305-380, Korea, Republic of
Conference title
THE 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE Portland, OR, USA, October 7-12, 2012 MATERIALS
Conference name
The 2012 APPLIED SUPERCONDUCTIVITY CONFERENCE (Portland, OR 2012-10-07)
Author (monograph)
Institute of Electrical and Electronics Engineers (IEEE), New York, NY, United States (Organiser of meeting)
Source

IEEE transactions on applied superconductivity. 2013, Vol 23, Num 3 ; 82003.1-82003.4 ; 3 ; ref : 10 ref

ISSN
1051-8223
Scientific domain
Electronics; Electrical engineering
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Author keyword
AC loss measurement contactless lead double layer conductor outer-lead total-lead
Keyword (fr)
Assemblage brasage tendre Assemblage circuit intégré Couche double Câble supraconducteur Distribution courant Etude comparative Forme cylindrique Loi uniforme Multicouche Perte courant alternatif Poste électrique Puissance électrique Supraconducteur haute température Corée Asie
Keyword (en)
Soldered joint Integrated circuit bonding Double layers Superconducting cable Current distribution Comparative study Cylindrical shape Uniform distribution Multiple layer AC losses Substation Electric power High temperature superconductor Korea Asia
Keyword (es)
Junta soldada Cable supraconductor Distribución corriente Estudio comparativo Forma cilíndrica Ley uniforme Capa múltiple Puesto eléctrico Potencia eléctrica Supraconductor alta temperatura Corea Asia
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G04 Electric connection. Cables. Wiring

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05I Electrical power engineering / 001D05I01 Power networks and lines / 001D05I01F Substations

Discipline
Electrical engineering. Electroenergetics Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27529819

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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