The inverse problem in magnetic force microscopy—inferring sample magnetization from MFM images
- Author
- RAWLINGS, Colin1 ; DURKAN, Colm1
[1] Nanoscience Centre, University of Cambridge, J J Thomson Avenue, Cambridge CB3 0FF, United Kingdom - Source
Nanotechnology (Bristol. Print). 2013, Vol 24, Num 30 ; 305705.1-305705.8 ; ref : 31 ref
- ISSN
- 0957-4484
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Aimantation Algorithme Champ extérieur Loi échelle Microscopie force magnétique Problème inverse Silicium 6837R
- Keyword (en)
- Magnetization Algorithms External fields Scaling laws Magnetic force microscopy Inverse problems Silicon
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16C Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27619516
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0957-4484/24/30/305705 
https://dx.doi.org/10.1088/0957-4484/24/30/305705
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